Не ви допада? Няма проблеми! Можете да върнете стоките до 30 дни
Няма да сбъркате с подаръчен ваучер. Получателят може да избере нещо от нашия асортимент с подаръчен ваучер.
До 30 дни за връщане на стоки
The progression developed in this book is essential to understand new test methodologies, algorithms and industrial practices. Without the insight into the physics of nano-metric technologies, it would be hard to develop system-level test strategies that yield a high IC fault coverage. Obviously, the work on defect-oriented testing presented in the book is not final, and it is an evolving field with interesting challenges imposed by the ever-changing nature of nano-metric technologies. Test and design practitioners from academia and industry will find that Defect-Oriented Testing for Nano-Metric CMOS VLSI Circuits lays the foundations for further pioneering work.
Здравейте! Аз съм Libroamiko, вашият книжен съветник.
Как мога да ви помогна?