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30 дни за връщане на стоката
A fully comprehensive examination of state-of-the-art technologies for measurement at the small scale§§Highlights the advanced research work from industry and academia in micro-nano devices test technology§Written at both introductory and advanced levels, provides the fundamentals and theories§Focuses on the measurement techniques for characterizing MEMS/NEMS devices§Companion website includes Lab View soft, micro-vision system test software, and algorithm software, enhancing the learning experience