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Книги на английски > Technology, Engineering, Agriculture > Electronics & communications engineering > Electronics engineering > Electronics: circuits & components > Practical RF Amplifier Design and Performance Optimization with SPICE and Load- and Source-pull Techniques

Practical RF Amplifier Design and Performance Optimization with SPICE and Load- and Source-pull Techniques

Name: Practical RF Amplifier Design and Performance Optimization with SPICE and Load- and Source-pull Techniques
Brand: Springer Nature Switzerland AG
SKU: 35402715
Price: 127.3 EUR
Availability: InStock
Author: Amal Banerjee
ISBN: 9783030625115

Amal Banerjee

Език

Английски език

Книга С твърди корици

Код Либристо: 35402715

Издателство Springer Nature Switzerland AG, март 2021

This book explains and demonstrates with an exhaustive set of design examples, how common types of r... Цялото описание

Код Либристо: 35402715

309 b

127.30 €

248.98 лв

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This book explains and demonstrates with an exhaustive set of design examples, how common types of radio frequency(RF) amplifiers (classes A, B, AB, C, D, E, F, G and H) can be designed, and then have their performance characteristics evaluated and optimized with SPICE. The author demonstrates the transient analysis features of SPICE, along with industry-standard load- and source-pull techniques to simulate the steady-state, long-term time-domain behavior of any test RF amplifier.· Describes methods for designing and evaluating/optimizing the performance characteristics of an RF amplifier that circumvent the issues involved with existing, traditional methods and don't require expensive, high-end software tools;· Includes C language executables for each RF amplifier type, eliminating errors that might creep in while computing passive component (capacitor, inductor, resistor) values for a given RF amplifier type;· Demonstrates industry-standard load- and source-pull schemes that can be included easily in text SPICE netlists, allowing accurate calculation of impedance matching and impedance values at the input and output ports of the test RF amplifier, eliminating messy, error-prone S parameter based calculations.